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Geotechnical reliability-based design and links with partial factors design approach
日期:2015-06-12  来源:学术报告  阅读:3515

    报告人: Prof. Bak Kong LOW(刘墨光)

 
  时   间: 2015-06-18 15:00
 
  地   点: 木兰楼A1006
 
  报告人简介:
 
  Bak Kong LOW, F.ASCE
 
  PhD (U.C.Berkeley), MS and BS (MIT)
 
  Associate Professor
 
  School of Civil and Environmental Engineering
 
  College of Engineering
 
  Nanyang Technological University, Singapore
 
  Email address: bklow@alum.mit.edu
 
  Homepage: http://alum.mit.edu/www/bklow
 
  Prof. Bak Kong LOW (刘墨光) obtained his BS and MS degrees in civil engineering from the Massachusetts Institute of Technology (MIT) in 1979, and PhD degree from the University of California at Berkeley in 1985. He is a Fellow of the American Society of Civil Engineers since 2000.  Apart from his long teaching and research career in soil and rock engineering at the Nanyang Technological University (NTU) of Singapore, Prof. LOW also conducted research while on sabbatical leaves at HKUST in 1996, University of Texas at Austin in 1997, and the Norwegian Geotechnical Institute in 2006. His research interests include reliability-based design in geotechnical engineering, soil and rock slope stability, underground rock engineering, and engineering ground improvement. List of his publications can be found at http://www.ntu.edu.sg/home/cbklow/.
 
  报告内容:
 
  Reliability-based design (RBD) can overcome some limitations in the design approaches based on partial factors (e.g. Eurocode 7). This lecture will present practical procedures for reliability analysis in geotechnical engineering, and illustrate reliability-based design in the context of a shallow foundation, a clay slope with spatial variability, a laterally loaded pile requiring implicit numerical analysis, and an anchored sheet pile wall. The effects of parametric uncertainties and correlations on the estimated failure probability and the advantages of reliability-based design and how it can play a very useful role to complement the partial factors design approach will be discussed.

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